Novel technique measures warpage in next-gen integrated circuits

//Novel technique measures warpage in next-gen integrated circuits

Novel technique measures warpage in next-gen integrated circuits

School of Electronic Engineering research making waves at one of Europe’s largest research facilities, the Diamond Light Source in Oxfordshire, UK.

http://www.diamond.ac.uk/Science/Research/Highlights/2017/warped-microchips.html

2017-06-02T13:25:03+00:00 May 16th, 2017|News|0 Comments

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